* Corresponding authors

^a Electronic Components, Technology and Materials, Delft University of Technology, 2628 CD Delft, The Netherlands
E-mail: G.Q.Zhang@tudelft.nl

^b School of Microelectronics, Southern University of Science and Technology, Shenzhen 518055, China
E-mail: yehy@sustech.edu.cn

^c The Key Laboratory of Optoelectronic Technology & Systems, Education Ministry of China, College of Optoelectronic Engineering, Chongqing University, Chongqing 400044, China

^d Shenzhen Institute of Wide-Bandgap Semiconductors, No. 1088, Xueyuan Rd, Xili, Nanshan District, Shenzhen, Guangdong, China

^e Engineering Research Center of Integrated Circuits for Next-Generation Communications, Ministry of Education, Nanshan District, Shenzhen, Guangdong, China

^f Signify, High Tech Campus 7, 5656AE Eindhoven, The Netherlands
E-mail: Willem.van.driel@signify.com